The effect of annealing on stacking faults and Jc values of PMP processed YBCO

P. X. Zhang, L. Zhou, P. Ji, W. M. Blan, X. Z. Wu, Z. H. Lai

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26 引用 (Scopus)

摘要

Highly textured YBCO bulk materials with dense stacking faults were prepared by the powder melting process (PMP). We re-annealed the samples at temperatures between 800 degrees C and 900 degrees C to reduce the stacking faults in YBa2Cu3Oy (123) crystals. The microstructural characteristics of these samples were investigated by SEM and TEM, and their critical current densities were estimated from magnetization hysteresis loops. The results indicate that both the density of stacking faults and the Jc values decrease considerably after the reheat treatments. The reasons for the elimination of stacking faults by annealing the specimens at high temperature are discussed.

源语言英语
文章编号003
页(从-至)15-19
页数5
期刊Superconductor Science and Technology
8
1
DOI
出版状态已出版 - 1995
已对外发布

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