The effect of annealing on stacking faults and Jc values of PMP processed YBCO

P. X. Zhang, L. Zhou, P. Ji, W. M. Blan, X. Z. Wu, Z. H. Lai

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

Highly textured YBCO bulk materials with dense stacking faults were prepared by the powder melting process (PMP). We re-annealed the samples at temperatures between 800 degrees C and 900 degrees C to reduce the stacking faults in YBa2Cu3Oy (123) crystals. The microstructural characteristics of these samples were investigated by SEM and TEM, and their critical current densities were estimated from magnetization hysteresis loops. The results indicate that both the density of stacking faults and the Jc values decrease considerably after the reheat treatments. The reasons for the elimination of stacking faults by annealing the specimens at high temperature are discussed.

Original languageEnglish
Article number003
Pages (from-to)15-19
Number of pages5
JournalSuperconductor Science and Technology
Volume8
Issue number1
DOIs
StatePublished - 1995
Externally publishedYes

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