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西北工业大学 国内
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Multiferroic and resistive switching behaviors in BiFe
0.95
Cr
0.05
O
3
thin films deposited on Pt/Ti/SiO
2
/Si substrates
B. C. Luo,
J. Wang
, X. S. Cao, K. X. Jin, C. L. Chen
材料学院
Northwestern Polytechnical University Xian
Changzhou University
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探究 'Multiferroic and resistive switching behaviors in BiFe
0.95
Cr
0.05
O
3
thin films deposited on Pt/Ti/SiO
2
/Si substrates' 的科研主题。它们共同构成独一无二的指纹。
分类
加权
按字母排序
Engineering
Thin Films
100%
Silicon Dioxide
100%
Resistive
100%
Si Substrate
100%
Room Temperature
66%
Piezoelectric
33%
Polycrystalline
33%
Magnetron
33%
Radio Frequency
33%
Oxygen Vacancy
33%
Piezoelectric Coefficient
33%
Physics
Thin Films
100%
Resistive Switching
100%
Multiferroic Material
100%
Room Temperature
66%
Magnetron Sputtering
33%
Perovskites
33%
Oxygen Vacancy
33%
Magnetic Property
33%
Piezoelectricity
33%
Polycrystalline
33%
Piezoelectricity
33%
Ferroelectricity
33%
Material Science
Thin Films
100%
Multiferroic Material
100%
Film
33%
Piezoelectricity
33%
Piezoelectric Property
33%
Oxygen Vacancy
33%
Magnetron Sputtering
33%
Magnetic Property
33%
Ferroelectricity
33%