Flux growth and dielectric properties of relaxor-based Pb(In _1/2Nb_1/2)O₃-PbTiO₃ single crystals

Relaxor-based piezoelectric single crystals of lead indium niobate-lead titanate (0.63Pb(In_1/2Nb_1/2)-0.37PbTiO₃, abbreviated as PIN-PT), in the vicinity of the morphotropic phase boundary, were prepared by a flux method. The compositions of the flux, Pb₃O ₄ or PbF₂, play different role in perovskite stability and phase development. Thus, pure perovskite PIN-PT single crystals with the size of 2∼5 mm were obtained by using Pb₃O₄ flux as well as a small amount of B₂O₃ additive. The microstructure and the phase development of the as-grown single crystals were investigated by scanning electron microscopy and transmission electron microscopy and X-ray diffraction. Furthermore, the dielectric properties of the 〈100〉- oriented PIN-PT single crystals were measured in the temperature range between 20°C and 400°C.