Flux growth and dielectric properties of relaxor-based Pb(In 1/2Nb1/2)O3-PbTiO3 single crystals

Huiqing Fan

doi:10.4028/0-87849-960-1.4179

Flux growth and dielectric properties of relaxor-based Pb(In _1/2Nb_1/2)O₃-PbTiO₃ single crystals

Huiqing Fan

School of Materials Sience and Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

Relaxor-based piezoelectric single crystals of lead indium niobate-lead titanate (0.63Pb(In_1/2Nb_1/2)-0.37PbTiO₃, abbreviated as PIN-PT), in the vicinity of the morphotropic phase boundary, were prepared by a flux method. The compositions of the flux, Pb₃O ₄ or PbF₂, play different role in perovskite stability and phase development. Thus, pure perovskite PIN-PT single crystals with the size of 2∼5 mm were obtained by using Pb₃O₄ flux as well as a small amount of B₂O₃ additive. The microstructure and the phase development of the as-grown single crystals were investigated by scanning electron microscopy and transmission electron microscopy and X-ray diffraction. Furthermore, the dielectric properties of the 〈100〉- oriented PIN-PT single crystals were measured in the temperature range between 20°C and 400°C.

Original language	English
Pages (from-to)	4179-4182
Number of pages	4
Journal	Materials Science Forum
Volume	475-479
Issue number	V
DOIs	https://doi.org/10.4028/0-87849-960-1.4179
State	Published - 2005
Event	PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China Duration: 2 Nov 2004 → 5 Nov 2004

Keywords

Dielectric property
Microstructure
Pb(InNb)O-PbTiO
Perovskite
Single crystal growth

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10.4028/0-87849-960-1.4179

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@article{c180f6d7009e42b589aec2cdbf9cff8f,

title = "Flux growth and dielectric properties of relaxor-based Pb(In 1/2Nb1/2)O3-PbTiO3 single crystals",

abstract = "Relaxor-based piezoelectric single crystals of lead indium niobate-lead titanate (0.63Pb(In1/2Nb1/2)-0.37PbTiO3, abbreviated as PIN-PT), in the vicinity of the morphotropic phase boundary, were prepared by a flux method. The compositions of the flux, Pb3O 4 or PbF2, play different role in perovskite stability and phase development. Thus, pure perovskite PIN-PT single crystals with the size of 2∼5 mm were obtained by using Pb3O4 flux as well as a small amount of B2O3 additive. The microstructure and the phase development of the as-grown single crystals were investigated by scanning electron microscopy and transmission electron microscopy and X-ray diffraction. Furthermore, the dielectric properties of the 〈100〉- oriented PIN-PT single crystals were measured in the temperature range between 20°C and 400°C.",

keywords = "Dielectric property, Microstructure, Pb(InNb)O-PbTiO, Perovskite, Single crystal growth",

author = "Huiqing Fan",

year = "2005",

doi = "10.4028/0-87849-960-1.4179",

language = "英语",

volume = "475-479",

pages = "4179--4182",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications Ltd",

number = "V",

note = "PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing ; Conference date: 02-11-2004 Through 05-11-2004",

}

TY - JOUR

T1 - Flux growth and dielectric properties of relaxor-based Pb(In 1/2Nb1/2)O3-PbTiO3 single crystals

AU - Fan, Huiqing

PY - 2005

Y1 - 2005

N2 - Relaxor-based piezoelectric single crystals of lead indium niobate-lead titanate (0.63Pb(In1/2Nb1/2)-0.37PbTiO3, abbreviated as PIN-PT), in the vicinity of the morphotropic phase boundary, were prepared by a flux method. The compositions of the flux, Pb3O 4 or PbF2, play different role in perovskite stability and phase development. Thus, pure perovskite PIN-PT single crystals with the size of 2∼5 mm were obtained by using Pb3O4 flux as well as a small amount of B2O3 additive. The microstructure and the phase development of the as-grown single crystals were investigated by scanning electron microscopy and transmission electron microscopy and X-ray diffraction. Furthermore, the dielectric properties of the 〈100〉- oriented PIN-PT single crystals were measured in the temperature range between 20°C and 400°C.

AB - Relaxor-based piezoelectric single crystals of lead indium niobate-lead titanate (0.63Pb(In1/2Nb1/2)-0.37PbTiO3, abbreviated as PIN-PT), in the vicinity of the morphotropic phase boundary, were prepared by a flux method. The compositions of the flux, Pb3O 4 or PbF2, play different role in perovskite stability and phase development. Thus, pure perovskite PIN-PT single crystals with the size of 2∼5 mm were obtained by using Pb3O4 flux as well as a small amount of B2O3 additive. The microstructure and the phase development of the as-grown single crystals were investigated by scanning electron microscopy and transmission electron microscopy and X-ray diffraction. Furthermore, the dielectric properties of the 〈100〉- oriented PIN-PT single crystals were measured in the temperature range between 20°C and 400°C.

KW - Dielectric property

KW - Microstructure

KW - Pb(InNb)O-PbTiO

KW - Perovskite

KW - Single crystal growth

UR - http://www.scopus.com/inward/record.url?scp=17044412184&partnerID=8YFLogxK

U2 - 10.4028/0-87849-960-1.4179

DO - 10.4028/0-87849-960-1.4179

M3 - 会议文章

AN - SCOPUS:17044412184

SN - 0255-5476

VL - 475-479

SP - 4179

EP - 4182

JO - Materials Science Forum

JF - Materials Science Forum

IS - V

T2 - PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing

Y2 - 2 November 2004 through 5 November 2004

ER -

Flux growth and dielectric properties of relaxor-based Pb(In _1/2Nb_1/2)O₃-PbTiO₃ single crystals

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Keywords

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