@inproceedings{a05e42ae3bb54c7c826a77d5a9a487ec,
title = "Evaluation Method of CMOS Devices Reliability at Cryogenic Temperature Based on SSI Model",
abstract = "With the development of deep-space exploration, electronic components and integrated circuits in the spacecraft must face the harsh environment in deep space, including cryogenic temperature. For CMOS devices, cryogenic temperature may cause issues in reliability. To qualify the normal application of CMOS devices, an evaluation method of CMOS devices at cryogenic temperature based on stress-strength interference theory was proposed. Moreover, according to the method, stress-strength interference models were built to calculate the failure probability of SN74AHC14 CMOS Inverters at cryogenic temperature.",
keywords = "CMOS, evaluation, low temperature, reliability",
author = "Xueqi Yang and Guicui Fu and Bo Wan and Yutai Su",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 4th International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020 ; Conference date: 05-08-2020 Through 07-08-2020",
year = "2020",
month = aug,
day = "5",
doi = "10.1109/SDPC49476.2020.9353171",
language = "英语",
series = "Proceedings of 2020 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "87--92",
editor = "Yong Qin and Zuo, {Ming J.} and Xiaojian Yi and Limin Jia and Dejan Gjorgjevikj",
booktitle = "Proceedings of 2020 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2020",
}