摘要
As for a two phase TiAl-based alloy, γ/α2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.
源语言 | 英语 |
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文章编号 | 112056 |
期刊 | Materials Characterization |
卷 | 190 |
DOI | |
出版状态 | 已出版 - 8月 2022 |