Characterization of various interfaces in a TiAl-based alloy

Xiangyu Gao, Jie Wang, Dan Feng, Xiubo Yang, Rui Hu, Yulun Wu, Zitong Gao, Feng Liu

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

As for a two phase TiAl-based alloy, γ/α2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.

Original languageEnglish
Article number112056
JournalMaterials Characterization
Volume190
DOIs
StatePublished - Aug 2022

Keywords

  • 120° rotational boundary
  • High resolution electron microscopy
  • Phase boundary
  • Pseudo-twin
  • TiAl alloy
  • True twin

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