A method for determining differential life test scheme for space components

Xiujuan Zhao, Guicui Fu, Yutai Su

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper has proposed a method to guarantee high reliability and long-life guarantee aerospace components. According to the different system reliability index, based on the system engineering theory, the different components reliability index is obtained through the reliability distribution, and a reasonable index system is established. According to different indicators, the sampling plan and test plan of components can be formulated. Taking SRAM devices for example, the sampling scheme corresponding to different sampling risks is given and the test time under different test conditions is determined.

源语言英语
主期刊名Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
出版商Institute of Electrical and Electronics Engineers Inc.
8546-8550
页数5
ISBN(电子版)9781538611272
DOI
出版状态已出版 - 15 12月 2017
已对外发布
活动43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, 中国
期限: 29 10月 20171 11月 2017

出版系列

姓名Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
2017-January

会议

会议43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
国家/地区中国
Beijing
时期29/10/171/11/17

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