A method for determining differential life test scheme for space components

Xiujuan Zhao, Guicui Fu, Yutai Su

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper has proposed a method to guarantee high reliability and long-life guarantee aerospace components. According to the different system reliability index, based on the system engineering theory, the different components reliability index is obtained through the reliability distribution, and a reasonable index system is established. According to different indicators, the sampling plan and test plan of components can be formulated. Taking SRAM devices for example, the sampling scheme corresponding to different sampling risks is given and the test time under different test conditions is determined.

Original languageEnglish
Title of host publicationProceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages8546-8550
Number of pages5
ISBN (Electronic)9781538611272
DOIs
StatePublished - 15 Dec 2017
Externally publishedYes
Event43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, China
Duration: 29 Oct 20171 Nov 2017

Publication series

NameProceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
Volume2017-January

Conference

Conference43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
Country/TerritoryChina
CityBeijing
Period29/10/171/11/17

Keywords

  • differentiation
  • reliability
  • sampling
  • test scheme

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