Influence of preparation process on microstructure, critical current density and Tc of MgB2/Fe/Cu wires

Y. F. Wu, G. Yan, J. S. Li, Y. Feng, S. K. Chen, H. P. Tang, H. L. Xu, C. S. Li, P. X. Zhang, Y. F. Lu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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