Improvement for electrical conductivity of Ti3SiC2/Cu joint brazed with a novel Sn6Ag7Ni4Co2Ti low-melting high entropy alloy filler

Xin Nai, Haiyan Chen, Shuai Zhao, Fenjun Liu, Zhikang Shen, Wenya Li

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Reducing the interfacial electrical resistance of Ti3SiC2/Cu joint has significant value to promote its application in the field of electrical contact. In the study, a novel Sn6Ag7Ni4Co2Ti low-melting high entropy alloy (HEA) was designed and fabricated, and a sound Ti3SiC2/Cu brazed joint was obtained using above filler. The interface of Ti3SiC2/Cu joint brazed with Sn6Ag7Ni4Co2Ti filler is mainly composed of Ag(s,s), Cu(s,s) and a few (Ni, Co)2Si. Compared with Ti3SiC2/Cu joint brazed with Ag-26.7Cu-4.5Ti filler, the electrical resistance of the joint brazed with Sn6Ag7Ni4Co2Ti filler is lower at all test temperatures, which is reduced by up to 15.99% when the test temperature is 300 °C.

Original languageEnglish
Article number132488
JournalMaterials Letters
Volume322
DOIs
StatePublished - 1 Sep 2022

Keywords

  • Ceramics
  • Electrical properties
  • Interfaces
  • Microstructure
  • Welding

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