Abstract
The fabrication of positively patterned conducting polymer microstructures was discussed. The conducting polymer structures were fabricated by one-step electropolymerization. The atomic force microscopic (AFM) measurement of the octadecyltrichlorosilane patterned silicon substrate using stamp showed the light replication of the poly(dimethylsiloxane) stamp.
Original language | English |
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Pages (from-to) | 1367-1370 |
Number of pages | 4 |
Journal | Advanced Materials |
Volume | 15 |
Issue number | 16 |
DOIs | |
State | Published - 15 Aug 2003 |
Externally published | Yes |