The sampling inspection method based on sequential posterior odd test

From the view point of the sample size can be reduced greatly by using the sequential posterior odd test (SPOT) method. Combining with the sampling inspection, a sampling inspection method for pass-fail data distribution based on SPOT was discussed in detail. The main contribution of this paper is that the proposed method combined the excellencies of SPOT method and sampling inspection method, so which not only can reduce the sample size due to making effectively use of the prior information, but also can very easily make sampling inspection project. A special sampling inspection case was presented, through computer simulation; the result shows that the proposed method is feasible, and demonstrates that it is better than traditional sampling inspection method for effective to reduce the sample size.