The sampling inspection method based on sequential posterior odd test

Zhaoyong Mao; Baowei Song

doi:10.1109/ICCIS.2010.46

The sampling inspection method based on sequential posterior odd test

Zhaoyong Mao, Baowei Song

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

From the view point of the sample size can be reduced greatly by using the sequential posterior odd test (SPOT) method. Combining with the sampling inspection, a sampling inspection method for pass-fail data distribution based on SPOT was discussed in detail. The main contribution of this paper is that the proposed method combined the excellencies of SPOT method and sampling inspection method, so which not only can reduce the sample size due to making effectively use of the prior information, but also can very easily make sampling inspection project. A special sampling inspection case was presented, through computer simulation; the result shows that the proposed method is feasible, and demonstrates that it is better than traditional sampling inspection method for effective to reduce the sample size.

Original language	English
Title of host publication	Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010
Pages	163-166
Number of pages	4
DOIs	https://doi.org/10.1109/ICCIS.2010.46
State	Published - 2010
Event	2010 International Conference on Computational and Information Sciences, ICCIS2010 - Chengdu, Sichuan, China Duration: 17 Dec 2010 → 19 Dec 2010

Publication series

Name	Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010

Conference

Conference	2010 International Conference on Computational and Information Sciences, ICCIS2010
Country/Territory	China
City	Chengdu, Sichuan
Period	17/12/10 → 19/12/10

Keywords

Bayesian theory
Sampling inspection
Sequential posterior odd test

Access to Document

10.1109/ICCIS.2010.46

Cite this

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title = "The sampling inspection method based on sequential posterior odd test",

abstract = "From the view point of the sample size can be reduced greatly by using the sequential posterior odd test (SPOT) method. Combining with the sampling inspection, a sampling inspection method for pass-fail data distribution based on SPOT was discussed in detail. The main contribution of this paper is that the proposed method combined the excellencies of SPOT method and sampling inspection method, so which not only can reduce the sample size due to making effectively use of the prior information, but also can very easily make sampling inspection project. A special sampling inspection case was presented, through computer simulation; the result shows that the proposed method is feasible, and demonstrates that it is better than traditional sampling inspection method for effective to reduce the sample size.",

keywords = "Bayesian theory, Sampling inspection, Sequential posterior odd test",

author = "Zhaoyong Mao and Baowei Song",

year = "2010",

doi = "10.1109/ICCIS.2010.46",

language = "英语",

isbn = "9780769542706",

series = "Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010",

pages = "163--166",

booktitle = "Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010",

note = "2010 International Conference on Computational and Information Sciences, ICCIS2010 ; Conference date: 17-12-2010 Through 19-12-2010",

}

Mao, Z & Song, B 2010, The sampling inspection method based on sequential posterior odd test. in Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010., 5709039, Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010, pp. 163-166, 2010 International Conference on Computational and Information Sciences, ICCIS2010, Chengdu, Sichuan, China, 17/12/10. https://doi.org/10.1109/ICCIS.2010.46

The sampling inspection method based on sequential posterior odd test. / Mao, Zhaoyong ; Song, Baowei.
Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010. 2010. p. 163-166 5709039 (Proceedings - 2010 International Conference on Computational and Information Sciences, ICCIS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The sampling inspection method based on sequential posterior odd test

AU - Mao, Zhaoyong

AU - Song, Baowei

PY - 2010

Y1 - 2010

N2 - From the view point of the sample size can be reduced greatly by using the sequential posterior odd test (SPOT) method. Combining with the sampling inspection, a sampling inspection method for pass-fail data distribution based on SPOT was discussed in detail. The main contribution of this paper is that the proposed method combined the excellencies of SPOT method and sampling inspection method, so which not only can reduce the sample size due to making effectively use of the prior information, but also can very easily make sampling inspection project. A special sampling inspection case was presented, through computer simulation; the result shows that the proposed method is feasible, and demonstrates that it is better than traditional sampling inspection method for effective to reduce the sample size.

AB - From the view point of the sample size can be reduced greatly by using the sequential posterior odd test (SPOT) method. Combining with the sampling inspection, a sampling inspection method for pass-fail data distribution based on SPOT was discussed in detail. The main contribution of this paper is that the proposed method combined the excellencies of SPOT method and sampling inspection method, so which not only can reduce the sample size due to making effectively use of the prior information, but also can very easily make sampling inspection project. A special sampling inspection case was presented, through computer simulation; the result shows that the proposed method is feasible, and demonstrates that it is better than traditional sampling inspection method for effective to reduce the sample size.

KW - Bayesian theory

KW - Sampling inspection

KW - Sequential posterior odd test

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T2 - 2010 International Conference on Computational and Information Sciences, ICCIS2010

Y2 - 17 December 2010 through 19 December 2010

ER -

The sampling inspection method based on sequential posterior odd test

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Keywords

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