TY - GEN
T1 - Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy
AU - Zhang, Jiwei
AU - Ma, Chaojie
AU - Li, Ying
AU - Di, Jianglei
AU - Xi, Teli
AU - Zhao, Jianlin
N1 - Publisher Copyright:
© OSA 2016.
PY - 2016/7/18
Y1 - 2016/7/18
N2 - In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.
AB - In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.
UR - http://www.scopus.com/inward/record.url?scp=85165740085&partnerID=8YFLogxK
U2 - 10.1364/DH.2016.DTh3F.6
DO - 10.1364/DH.2016.DTh3F.6
M3 - 会议稿件
AN - SCOPUS:85165740085
SN - 9781943580156
T3 - Optics InfoBase Conference Papers
BT - Digital Holography and Three-Dimensional Imaging, DH 2016
PB - Optica Publishing Group (formerly OSA)
T2 - Digital Holography and Three-Dimensional Imaging, DH 2016
Y2 - 25 July 2016 through 28 July 2016
ER -