Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy

Jiwei Zhang; Chaojie Ma; Ying Li; Jianglei Di; Teli Xi; Jianlin Zhao

doi:10.1364/DH.2016.DTh3F.6

Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy

Jiwei Zhang, Chaojie Ma, Ying Li, Jianglei Di, Teli Xi, Jianlin Zhao

School of Physical Science and Technology

Northwestern Polytechnical University Xian

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.

Original language	English
Title of host publication	Digital Holography and Three-Dimensional Imaging, DH 2016
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Print)	9781943580156
DOIs	https://doi.org/10.1364/DH.2016.DTh3F.6
State	Published - 18 Jul 2016
Event	Digital Holography and Three-Dimensional Imaging, DH 2016 - Heidelberg, Germany Duration: 25 Jul 2016 → 28 Jul 2016

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Digital Holography and Three-Dimensional Imaging, DH 2016
Country/Territory	Germany
City	Heidelberg
Period	25/07/16 → 28/07/16

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10.1364/DH.2016.DTh3F.6

Cite this

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title = "Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy",

abstract = "In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.",

author = "Jiwei Zhang and Chaojie Ma and Ying Li and Jianglei Di and Teli Xi and Jianlin Zhao",

note = "Publisher Copyright: {\textcopyright} OSA 2016.; Digital Holography and Three-Dimensional Imaging, DH 2016 ; Conference date: 25-07-2016 Through 28-07-2016",

year = "2016",

month = jul,

day = "18",

doi = "10.1364/DH.2016.DTh3F.6",

language = "英语",

isbn = "9781943580156",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Digital Holography and Three-Dimensional Imaging, DH 2016",

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Zhang, J, Ma, C, Li, Y, Di, J, Xi, T & Zhao, J 2016, Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy. in Digital Holography and Three-Dimensional Imaging, DH 2016. Optics InfoBase Conference Papers, Optica Publishing Group (formerly OSA), Digital Holography and Three-Dimensional Imaging, DH 2016, Heidelberg, Germany, 25/07/16. https://doi.org/10.1364/DH.2016.DTh3F.6

Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy. / Zhang, Jiwei; Ma, Chaojie; Li, Ying et al.
Digital Holography and Three-Dimensional Imaging, DH 2016. Optica Publishing Group (formerly OSA), 2016. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy

AU - Zhang, Jiwei

AU - Ma, Chaojie

AU - Li, Ying

AU - Di, Jianglei

AU - Xi, Teli

AU - Zhao, Jianlin

PY - 2016/7/18

Y1 - 2016/7/18

N2 - In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.

AB - In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.

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DO - 10.1364/DH.2016.DTh3F.6

M3 - 会议稿件

AN - SCOPUS:85165740085

SN - 9781943580156

T3 - Optics InfoBase Conference Papers

BT - Digital Holography and Three-Dimensional Imaging, DH 2016

PB - Optica Publishing Group (formerly OSA)

T2 - Digital Holography and Three-Dimensional Imaging, DH 2016

Y2 - 25 July 2016 through 28 July 2016

ER -

Simultaneous measurement of thickness and refractive index using spectrum multiplexing digital holographic microscopy

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