TY - GEN
T1 - Fault Localization and Test Oracle Generation Based on the Mutual Pattern of Discrete Path Variables
AU - Chen, Jing
AU - Ma, Chunyan
AU - Chang, Zheng
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - Fault localization and test oracle generation are the key techniques for software quality assurance in the software development process. This study proposes a method for fault localization and test oracle generation based on the mutual pattern of discrete path variables. First, we define the discrete path variable and the mutual pattern based on program inputs. After that, the calculated method of the discrete path variable is given, and the mutual pattern is solved based on the FP-growth algorithm. Finally, we respectively propose the method of fault localization and test oracle generation based on the mutual pattern. In addition, we design a series of auxiliary tools and select three typical cases in the Software-artifact Infrastructure Repository for experimental verification. The results prove that this method can reduce the scope of program faults to code fragments and the average accuracy of test oracle generation is about 80%.
AB - Fault localization and test oracle generation are the key techniques for software quality assurance in the software development process. This study proposes a method for fault localization and test oracle generation based on the mutual pattern of discrete path variables. First, we define the discrete path variable and the mutual pattern based on program inputs. After that, the calculated method of the discrete path variable is given, and the mutual pattern is solved based on the FP-growth algorithm. Finally, we respectively propose the method of fault localization and test oracle generation based on the mutual pattern. In addition, we design a series of auxiliary tools and select three typical cases in the Software-artifact Infrastructure Repository for experimental verification. The results prove that this method can reduce the scope of program faults to code fragments and the average accuracy of test oracle generation is about 80%.
KW - discrete path variable
KW - failure causing schema
KW - fault localization
KW - test oracle
UR - http://www.scopus.com/inward/record.url?scp=85140905336&partnerID=8YFLogxK
U2 - 10.1109/QRS-C55045.2021.00056
DO - 10.1109/QRS-C55045.2021.00056
M3 - 会议稿件
AN - SCOPUS:85140905336
T3 - Proceedings - 2021 21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021
SP - 326
EP - 332
BT - Proceedings - 2021 21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021
Y2 - 6 December 2021 through 10 December 2021
ER -