Fault Localization and Test Oracle Generation Based on the Mutual Pattern of Discrete Path Variables

Jing Chen, Chunyan Ma, Zheng Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Fault localization and test oracle generation are the key techniques for software quality assurance in the software development process. This study proposes a method for fault localization and test oracle generation based on the mutual pattern of discrete path variables. First, we define the discrete path variable and the mutual pattern based on program inputs. After that, the calculated method of the discrete path variable is given, and the mutual pattern is solved based on the FP-growth algorithm. Finally, we respectively propose the method of fault localization and test oracle generation based on the mutual pattern. In addition, we design a series of auxiliary tools and select three typical cases in the Software-artifact Infrastructure Repository for experimental verification. The results prove that this method can reduce the scope of program faults to code fragments and the average accuracy of test oracle generation is about 80%.

Original languageEnglish
Title of host publicationProceedings - 2021 21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages326-332
Number of pages7
ISBN (Electronic)9781665478366
DOIs
StatePublished - 2021
Event21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021 - Virtual, Hainan, China
Duration: 6 Dec 202110 Dec 2021

Publication series

NameProceedings - 2021 21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021

Conference

Conference21st International Conference on Software Quality, Reliability and Security Companion, QRS-C 2021
Country/TerritoryChina
CityVirtual, Hainan
Period6/12/2110/12/21

Keywords

  • discrete path variable
  • failure causing schema
  • fault localization
  • test oracle

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