Defect proliferation in CsPbBr3 crystal induced by ion migration

Bin Bin Zhang, Fangbao Wang, Hongjian Zhang, Bao Xiao, Qihao Sun, Jun Guo, Ahmed Ben Hafsia, Aihui Shao, Yadong Xu, Jian Zhou

科研成果: 期刊稿件文章同行评审

82 引用 (Scopus)

摘要

Ion migration in halide perovskite materials usually brings an intractable problem in the working stability of solar cells and photoelectrical detectors. The mechanism of ion migration and its impact on physical properties are still open questions. In this work, the ion migration behavior in solution-grown CsPbBr3 crystals was observed by the hysteresis in current-voltage curves and the temperature dependent reversed current-time measurements. Defect proliferation phenomena (new defects of [VCs]- and [PbBr]2+) originating from ion migration were verified by thermally stimulated current spectroscopy. Our results also give evidence that Cs+ ions also participate in the process of ion migration except the widely considered Br- ions. Furthermore, the photoelectric properties of the CsPbBr3 device were found to be seriously deteriorated after the ion migration. Our work demonstrates the strong correlation between the ion migration and physical properties in halide perovskites.

源语言英语
文章编号063505
期刊Applied Physics Letters
116
6
DOI
出版状态已出版 - 10 2月 2020

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