摘要
A MoS2 channel FeFET with a P–Si gate was developed for use as a photosensor with a memory function. A current ratio of 104 was achieved at an irradiation power of 20 nW. The reliability of the device was evaluated by means of endurance tests, and a retention time of more than 1000 s was observed. Furthermore, in-sensor digital computing was verified by applying an optoelectronic hybrid logic AND gate. This novel optical sensing principle enables the development of new approaches for optoelectronic hybrid integration.
源语言 | 英语 |
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文章编号 | 199402 |
期刊 | Science China Information Sciences |
卷 | 67 |
期 | 9 |
DOI | |
出版状态 | 已出版 - 9月 2024 |