Dislocation-mediated coupling mechanism between the microstructural defects and Te inclusions in CdZnTe single crystals

Yihui He, Wanqi Jie, Yadong Xu, Yuecun Wang, Yan Zhou, Huimin Liu, Tao Wang, Gangqiang Zha

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

The dislocation-mediated coupling mechanism between the microstructural defects and Te inclusions in CdZnTe crystal have been investigated through the defect-selective etching and cathodoluminescence (CL). The enrichment of well-arranged dislocation-related defects was found around the Te inclusions. A dislocation-mediated defects interaction model was proposed and native deep-level defects were considered to be associated with induced dislocation motions, showing as a dark CL contrast. The spatial arrangement of the microstructural defects were confined to a stellated octahedron.

Original languageEnglish
Pages (from-to)17-20
Number of pages4
JournalScripta Materialia
Volume82
DOIs
StatePublished - 1 Jul 2014

Keywords

  • Cathodoluminescence (CL)
  • Compound semiconductors
  • Defects in semiconductors
  • Dislocation dynamics
  • Plastic deformation

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