Abstract
A fast and efficient method is proposed in this letter to characterize the dielectric permittivity of thin-film materials. The measuring system is based on a TE103 rectangular split-cavity resonator operating at around 10 GHz, which has the advantage of providing nondestructive measurements while maintaining a high level of accuracy. The thin-film materials under test can be directly inserted in the split without being processed in a specific shape. Different dielectric materials are tested using this method. And the theoretical derivations and experimental measurements have been performed to confirm the validity and effectiveness of this approach.
Original language | English |
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Pages (from-to) | 75-80 |
Number of pages | 6 |
Journal | Microwave and Optical Technology Letters |
Volume | 65 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2023 |
Keywords
- non-destructive
- permittivity
- split-cavity