A fast and efficient method for permittivity measurement of thin-film material

Tiancheng Qiu, Kangkang Han, Gao Wei, Siyuan Lei

Research output: Contribution to journalArticlepeer-review

Abstract

A fast and efficient method is proposed in this letter to characterize the dielectric permittivity of thin-film materials. The measuring system is based on a TE103 rectangular split-cavity resonator operating at around 10 GHz, which has the advantage of providing nondestructive measurements while maintaining a high level of accuracy. The thin-film materials under test can be directly inserted in the split without being processed in a specific shape. Different dielectric materials are tested using this method. And the theoretical derivations and experimental measurements have been performed to confirm the validity and effectiveness of this approach.

Original languageEnglish
Pages (from-to)75-80
Number of pages6
JournalMicrowave and Optical Technology Letters
Volume65
Issue number1
DOIs
StatePublished - Jan 2023

Keywords

  • non-destructive
  • permittivity
  • split-cavity

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