摘要
The two-dimensional electron gas (2DEG) at oxide heterointerface is particularly interesting for achieving abundant exotic physical properties. Herein, we report a 2DEG generated at the interfaces of amorphous-LaAlO3/TiO2 (a-LAO/TiO2) thin film heterostructures. Highly metallic interfaces are obtained for heterostructures with a-LAO and TiO2 layers that reach 2 nm and 5 nm, respectively. A high carrier density of ∼1014 cm-2 and low mobility of ∼10 cm2V-1s-1 were achieved. Also, unique negative magnetoresistance is detected in the 2DEG, arising from the weak localization mechanism. The discovery creates a new path to exploring the physics of low-dimensional oxide electronics and facilitates the integration of 2DEG with functional materials for multilayer interfaces.
源语言 | 英语 |
---|---|
文章编号 | 116512 |
期刊 | Scripta Materialia |
卷 | 258 |
DOI | |
出版状态 | 已出版 - 15 3月 2025 |