Thickness Dependence of Carrier Mobility and the Interface Trap Free Energy Investigated by Impedance Spectroscopy in Organic Semiconductors

Hui Xu, Wen Juan Zhai, Chao Tang, Shao Ya Qiu, Rui Lan Liu, Zhou Rong, Zong Qiang Pang, Bing Jiang, Jing Xiao, Chao Zhong, Bao Xiu Mi, Qu Li Fan, Wei Huang