TY - GEN
T1 - The foundation of microcircuits DPA photo library and the contribution to the electronic product PHM
AU - Zhang, Danqun
AU - Zhang, Sujuan
AU - Su, Yutai
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/12/16
Y1 - 2014/12/16
N2 - During the process of destructive physical analysis (DPA), a large amount of photos of external visual inspection, internal circuit destruction, X-ray inspection and logos of microcircuits will be acquired. The photos of qualified devices can be used as background information in the PHM monitoring of electronic products. Knowledge base of electronic products expert system consists of the failure mode, failure criterion and fundamental properties of electronic components that are assembled on the electronic products. A DPA photo library was built by the author of this paper, and the data source of the library was from the DPA test conclusion of the Second Test Center of Military Electronic Components of Beijing. In the library, the photos of microcircuit devices under test were classified by the inspection item, DPA conclusion, damage type, etc The foundation of DPA photo library is a great assistance to the PHM of electronic products and the foundation of expert system that can be used in the PHM of electronic products. This paper uses several series of electronic components' photos as cases to analyze the identities and differences of the components according to types. These cases include LM124J and JL137 from NS. The DPA photo library, acts as a handbook of electronic component failure information, can be an important part of PHM database of electronic products and expert system. The failure modes and microcircuit defects that implied in the library should be extracted and added in the PHM expert system.
AB - During the process of destructive physical analysis (DPA), a large amount of photos of external visual inspection, internal circuit destruction, X-ray inspection and logos of microcircuits will be acquired. The photos of qualified devices can be used as background information in the PHM monitoring of electronic products. Knowledge base of electronic products expert system consists of the failure mode, failure criterion and fundamental properties of electronic components that are assembled on the electronic products. A DPA photo library was built by the author of this paper, and the data source of the library was from the DPA test conclusion of the Second Test Center of Military Electronic Components of Beijing. In the library, the photos of microcircuit devices under test were classified by the inspection item, DPA conclusion, damage type, etc The foundation of DPA photo library is a great assistance to the PHM of electronic products and the foundation of expert system that can be used in the PHM of electronic products. This paper uses several series of electronic components' photos as cases to analyze the identities and differences of the components according to types. These cases include LM124J and JL137 from NS. The DPA photo library, acts as a handbook of electronic component failure information, can be an important part of PHM database of electronic products and expert system. The failure modes and microcircuit defects that implied in the library should be extracted and added in the PHM expert system.
KW - destructive physical analysis
KW - electronic products
KW - knowledge base
KW - photo library
UR - http://www.scopus.com/inward/record.url?scp=84943194418&partnerID=8YFLogxK
U2 - 10.1109/PHM.2014.6988257
DO - 10.1109/PHM.2014.6988257
M3 - 会议稿件
AN - SCOPUS:84943194418
T3 - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
SP - 669
EP - 672
BT - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 Prognostics and System Health Management Conference, PHM 2014
Y2 - 24 August 2014 through 27 August 2014
ER -