Short-coherence in-line phase-shifting infrared digital holographic microscopy for measurement of internal structure in silicon

Teli Xi, Jiazhen Dou, Jianglei Di, Ying Li, Jiwei Zhang, Chaojie Ma, Jianlin Zhao

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

1 引用 （Scopus）

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Physics

Engineering