Quality monitor in multi-operation machining processes based on wavelet filtering

B. Chen, P. Wang, D. H. Zhang, K. Liu

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The method of quality monitor based on wavelet filtering was proposed to solve the problems of quality control in multi-operation manufacturing processes, whose measurement data contained noise information. The multi-operation machining process quality control model based on the Stream of Variation (SoV) technology was built, which considered the error propagation. Based on this, the method of discrete wavelet transformation was adopted to smooth data and to reduce noise, and then control charts were built by the method of T-square control chart to monitor processes. The average run length (ARL) was adopted to verify the performance of the proposed quality control method. A sample application was developed to illustrate the feasibility and validity of the proposed quality monitor method.

源语言英语
主期刊名2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012
出版商IEEE Computer Society
2375-2379
页数5
ISBN(印刷版)9781467329453
DOI
出版状态已出版 - 2012
活动2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012 - Hong Kong, 中国
期限: 10 12月 201213 12月 2012

出版系列

姓名IEEE International Conference on Industrial Engineering and Engineering Management
ISSN(印刷版)2157-3611
ISSN(电子版)2157-362X

会议

会议2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012
国家/地区中国
Hong Kong
时期10/12/1213/12/12

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