Prediction of Electrical Characteristics of Fin Field-effect Transistor Devices Based on Simulation Using Deep Learning Method
Xiaoling Lai, Yangming Guo, Qianqiong Wang, Yuan Jie Lv, Dongliang Chen, Shulong Wang
科研成果: 期刊稿件 › 文章 › 同行评审
Xiaoling Lai, Yangming Guo, Qianqiong Wang, Yuan Jie Lv, Dongliang Chen, Shulong Wang
科研成果: 期刊稿件 › 文章 › 同行评审