Path Planning of Randomly Scattering Waypoints for Wafer Probing Based on Deep Attention Mechanism

Wafer probing is a critical process employed to measure the yield of wafer fabrication. The primary object of wafer probing is to find the defect grain on the wafer. After a full coverage check, there are always some suspected grains existing for further inspection. However, this second probing result could be affected by the shape of the probe card and the setting actions (path planning) of operators for grains randomly scattering on the wafer. Good grains can be damaged by reprobe actions, which decrease production performance and customer trust. In general, it also requires manpower to perform reprobing, which dramatically deteriorates the throughput of production. This article has studied this problem, and an adaptive coverage path planning (CPP) method for randomly scattering grains using an attention interface is proposed. The proposed randomly scattering waypoints method uses deep reinforcement learning (DRL) for automatic real-time path planning of the second detection. A soft attention interface accelerates the process with a less overlapped check. The experimental results demonstrate the efficiency of the proposed method in terms of less overlapping and steps, and this method learns a better CPP strategy for wafer probing than programmed paths and other RL-based methods.