Neural Network-based Classification of Breakdown Mechanisms and Prediction of breakdown Voltage and On-resistance for 4H-SiC Trench Gate MOS Devices

Jiaxi Zhang, Shiyan Zhang, Ze Sun, Yucheng Wang, Yupan Wu, Wei Li, Shaoxi Wang

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

1 引用 （Scopus）

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