Microstructure evolution and room temperature fracture toughness of an integrally directionally solidified Nb-Ti-Si based ultrahigh temperature alloy

Haisheng Guo, Xiping Guo

科研成果: 期刊稿件文章同行评审

124 引用 (Scopus)

摘要

Integrally directional solidification of an Nb-Ti-Si based ultrahigh temperature alloy was performed at 2000 °C with withdrawal rates varying from 2.5 to 100 μm s-1. The directionally solidified microstructure was composed of primary silicides and eutectic colonies that distributed evenly and aligned erectly along the growth direction. Both the average diameter and the lamellar spacing of eutectic cells decreased with increasing withdrawal rate. The room temperature fracture toughness was improved significantly by integrally directional solidification.

源语言英语
页(从-至)637-640
页数4
期刊Scripta Materialia
64
7
DOI
出版状态已出版 - 4月 2011

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