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西北工业大学 国内
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Microstructure evolution and mechanical behavior of copper through‑silicon via structure under thermal cyclic loading
Mingqi Lei, Yuexing Wang, Xiaofeng Yang,
Yao Yao
力学与土木建筑学院
Northwestern Polytechnical University Xian
China Academy of Engineering Physics
Ministry of Industry and Information Technology
Xi'an University of Architecture and Technology
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探究 'Microstructure evolution and mechanical behavior of copper through‑silicon via structure under thermal cyclic loading' 的科研主题。它们共同构成独一无二的指纹。
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Engineering
Microstructure Evolution
100%
Cyclic Loading
100%
Plasticity Theory
66%
Constitutive Model
33%
Finite Element Analysis
33%
Coefficient of Expansion
33%
Thermal Stress
33%
Failure Mode
33%
Fatigue Failure
33%
Grain Orientation
33%
Texture Evolution
33%
Power Fluctuation
33%
Thermal Fatigue
33%
Integrated Circuit
33%
Plastic Work
33%
Grain Size Effect
33%
Material Science
Grain Size
100%
Crystal Plasticity
66%
Plasticity Theory
66%
Finite Element Method
33%
Thermal Expansion
33%
Thermal Cycling
33%
Electron Backscatter Diffraction
33%
Thermal Stress
33%
Electronic Circuit
33%
Thermal Fatigue
33%