Microstructure and electrical properties of sol-gel derived Pb(Mg _1/3Nb_2/3)_0.7Ti_0.3O₃ thin films with single perovskite phase

Material Science

• Sol-Gel 100%
• Film 100%
• Thin Films 100%
• X-Ray Diffraction 20%
• Scanning Electron Microscopy 20%
• Permittivity 20%
• Coarsening 20%
• Annealing 20%
• Transmission Electron Microscopy 20%
• Dielectric Property 20%
• Ferroelectric Material 20%
• Auger Electron Spectroscopy 20%