摘要
The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher Tc generally have rather smaller lattice parameter c.
源语言 | 英语 |
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页(从-至) | 26-30 |
页数 | 5 |
期刊 | Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering |
卷 | 23 |
期 | 1 |
出版状态 | 已出版 - 2月 1994 |
已对外发布 | 是 |