TY - GEN
T1 - Influence of applied electric field on crystalline structure and thermo-optical effect of oriented PVDF thin films
AU - Liu, Wei Guo
AU - Xi, Ying Xue
AU - Fan, Hui Qing
AU - Yang, Chen
AU - Niu, Xiao Ling
PY - 2009
Y1 - 2009
N2 - The α phase oriented PVDF thin films were deposited using vacuum evaporation technology with a DC electric field applied on substrate holder during deposition process. X-ray Diffraction was used to examine the structural variations as a function of applied electric fields. DSC data allowed measurement of the melting temperatures and enthalpies of the PVDF granules and films deposited at various bias voltages, providing information on the changes in the crystallinity of the films. The thermo-optical (t.o) coefficient of α phase oriented PVDF thin films with different degree of crystallinity, which obtained by regulating the applied electric voltages varying from 0 to 5KV, were determined by using spectroscopic ellipsometer (SE) equipped with a heating stage. At temperatures ranging from 20 to 100°, the refractive index of all the PVDF films was negatively correlated with the temperature between 600 and 1600nm. The value of the t.o coefficient of PVDF films was calculated at all temperatures. During the deposition process, a decrease in the degree of crystallinity was observed with the increase of applied electric voltage. Furthermore, the absolute value of t.o. coefficient for film deposited at 5kV was slightly higher and decreased with increase in the degree of its crystallinity.
AB - The α phase oriented PVDF thin films were deposited using vacuum evaporation technology with a DC electric field applied on substrate holder during deposition process. X-ray Diffraction was used to examine the structural variations as a function of applied electric fields. DSC data allowed measurement of the melting temperatures and enthalpies of the PVDF granules and films deposited at various bias voltages, providing information on the changes in the crystallinity of the films. The thermo-optical (t.o) coefficient of α phase oriented PVDF thin films with different degree of crystallinity, which obtained by regulating the applied electric voltages varying from 0 to 5KV, were determined by using spectroscopic ellipsometer (SE) equipped with a heating stage. At temperatures ranging from 20 to 100°, the refractive index of all the PVDF films was negatively correlated with the temperature between 600 and 1600nm. The value of the t.o coefficient of PVDF films was calculated at all temperatures. During the deposition process, a decrease in the degree of crystallinity was observed with the increase of applied electric voltage. Furthermore, the absolute value of t.o. coefficient for film deposited at 5kV was slightly higher and decreased with increase in the degree of its crystallinity.
UR - http://www.scopus.com/inward/record.url?scp=74349125702&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2009.5307534
DO - 10.1109/ISAF.2009.5307534
M3 - 会议稿件
AN - SCOPUS:74349125702
SN - 9781424449699
T3 - IEEE International Symposium on Applications of Ferroelectrics
BT - 2009 18th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2009
T2 - 2009 18th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2009
Y2 - 23 August 2009 through 27 August 2009
ER -