Growth and characterization of doped CeO ₂ buffers on Ni-W substrates for coated conductors using metal organic deposition method

Material Science

• Film 100%
• Conductor 100%
• Surface (Surface Science) 33%
• Scanning Electron Microscopy 33%
• Crystal Structure 33%
• Buffer Layer 33%
• Atomic Force Microscopy 33%
• X-Ray Diffraction 16%
• Multilayer 16%
• Oxygen Vacancy 16%
• Crystal Lattice 16%
• Annealing 16%
• Lattice Constant 16%
• Differential Scanning Calorimetry 16%
• Elasticity 16%
• Surface Crack 16%
• Electron Microscopy 16%
• Lattice Mismatch 16%
• Crack Formation 16%