Effects of the length of thru on the measurement precision in TRL technique

Changying Wu; Yuanchao Xu; Jianying Li; Steven Gao

doi:10.1109/LMWC.2014.2361660

Effects of the length of thru on the measurement precision in TRL technique

Changying Wu, Yuanchao Xu, Jianying Li, Steven Gao

电子信息学院

科研成果: 期刊稿件 › 文章 › 同行评审

9 引用（Scopus）

摘要

The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

源语言	英语
文章编号	6924783
页（从-至）	905-907
页数	3
期刊	IEEE Microwave and Wireless Components Letters
卷	24
期	12
DOI	https://doi.org/10.1109/LMWC.2014.2361660
出版状态	已出版 - 1 12月 2014

访问文件

10.1109/LMWC.2014.2361660

其它文件与链接

链接到 Scopus 的出版物

引用此

@article{fafd16eb9ffd482fae51fa754e2cd734,

title = "Effects of the length of thru on the measurement precision in TRL technique",

abstract = "The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.",

keywords = "Calibration, error matrix, test fixture, thru-reflect-line (TRL) technique",

author = "Changying Wu and Yuanchao Xu and Jianying Li and Steven Gao",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.",

year = "2014",

month = dec,

day = "1",

doi = "10.1109/LMWC.2014.2361660",

language = "英语",

volume = "24",

pages = "905--907",

journal = "IEEE Microwave and Wireless Components Letters",

issn = "1531-1309",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "12",

}

TY - JOUR

T1 - Effects of the length of thru on the measurement precision in TRL technique

AU - Wu, Changying

AU - Xu, Yuanchao

AU - Li, Jianying

AU - Gao, Steven

PY - 2014/12/1

Y1 - 2014/12/1

N2 - The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

AB - The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

KW - Calibration

KW - error matrix

KW - test fixture

KW - thru-reflect-line (TRL) technique

UR - http://www.scopus.com/inward/record.url?scp=84914111041&partnerID=8YFLogxK

U2 - 10.1109/LMWC.2014.2361660

DO - 10.1109/LMWC.2014.2361660

M3 - 文章

AN - SCOPUS:84914111041

SN - 1531-1309

VL - 24

SP - 905

EP - 907

JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

IS - 12

M1 - 6924783

ER -

Effects of the length of thru on the measurement precision in TRL technique

摘要

访问文件

其它文件与链接

指纹

引用此