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Defect levels characterized by photoconductivity and thermally stimulated current in CdZnTe crystals
Lingyan Xu, Tao Feng,
Wanqi Jie
材料学院
Northwestern Polytechnical University Xian
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Engineering
Current Measurement
100%
Decay Time
100%
Deep Level
100%
Defect Density
100%
Exponential Function
100%
Photocurrent
100%
Time-of-Flight
100%
Chemistry
Deep Defect Level
33%
Deep Donor
66%
Defect Level
100%
Electron Mobility
66%
Photoconductivity
100%
Photocurrent
33%
Thermally Stimulated Current
100%
Physics
Electron Mobility
66%
Photoconductivity
100%
Photoelectric Emission
33%
Time Constant
33%
Material Science
Defect Density
33%
Electron Mobility
66%
Photoconductivity
100%
Chemical Engineering
Electric Current Measurement
100%