Crack paths in 2198-T8 offset hole SE(T) plates with FSW jointed under fatigue load

Yu E. Ma, Shuang Yun, Wen Hao He

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

指纹

探究 'Crack paths in 2198-T8 offset hole SE(T) plates with FSW jointed under fatigue load' 的科研主题。它们共同构成独一无二的指纹。

Material Science

Engineering