Complex refractive index measurement for atomic-layer materials via surface plasmon resonance holographic microscopy

Siqing Dai, Hua Lu, Jiwei Zhang, Yuping Shi, Jiazhen Dou, Jianglei Di, Jianlin Zhao

科研成果: 期刊稿件 › 文章 › 同行评审

12 引用 （Scopus）

指纹

探究 'Complex refractive index measurement for atomic-layer materials via surface plasmon resonance holographic microscopy' 的科研主题。它们共同构成独一无二的指纹。

Engineering

Material Science