An optical measurement system for high precision alignment of imaging detectors

X. Chang Zeng, W. Guan, J. Zhao, P. Huang, Z. Qiang Wang, S. Zhang, X. Zhou Zuo, G. Yang Xi, B. Wei Yu, W. Ping Zhang, Z. Li Wang, X. Zhang, X. Lian Lv, W. Zheng Yuan, X. Xiao Wang, Y. He

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

指纹

探究 'An optical measurement system for high precision alignment of imaging detectors' 的科研主题。它们共同构成独一无二的指纹。

Engineering

Physics