TY - GEN
T1 - A study of directional MEMS dual-fences gauge
AU - Ma, Chengyu
AU - Ma, Binghe
AU - Deng, Jinjun
AU - Jin, Xinhang
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/1
Y1 - 2015/7/1
N2 - In this paper, MEMS surface fence gauges are developed to measure simultaneously the magnitude and direction of wall shear stress in wind tunnel under two-dimensional turbulent boundary layers. The dual-fences are packaged together orthogonal to each other. In order to avoid the mutual influence caused by the flow field disturbance, the optimization analysis of the relative location of the two fences is carried out, and the simulation results indicate that the coupling influence between dual-fences was basically eliminated while the separation distance of two fences is four times its own length. Comparison experiments are made to verify the correctness of the flow simulation results, and the directional sensitivities of dual MEMS surface fence are calibrated, which indicated that MEMS dual-fences are equipped to distinguish direction of wall shear stress.
AB - In this paper, MEMS surface fence gauges are developed to measure simultaneously the magnitude and direction of wall shear stress in wind tunnel under two-dimensional turbulent boundary layers. The dual-fences are packaged together orthogonal to each other. In order to avoid the mutual influence caused by the flow field disturbance, the optimization analysis of the relative location of the two fences is carried out, and the simulation results indicate that the coupling influence between dual-fences was basically eliminated while the separation distance of two fences is four times its own length. Comparison experiments are made to verify the correctness of the flow simulation results, and the directional sensitivities of dual MEMS surface fence are calibrated, which indicated that MEMS dual-fences are equipped to distinguish direction of wall shear stress.
UR - http://www.scopus.com/inward/record.url?scp=84939484881&partnerID=8YFLogxK
U2 - 10.1109/NEMS.2015.7147465
DO - 10.1109/NEMS.2015.7147465
M3 - 会议稿件
AN - SCOPUS:84939484881
T3 - 2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
SP - 449
EP - 452
BT - 2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
Y2 - 7 April 2015 through 11 April 2015
ER -