A high-sensitive resonant electrometer based on mode localization of the weakly coupled resonators

Hemin Zhang, Weizheng Yuan, Jie Huang, Boyang Li, Honglong Chang

科研成果: 书/报告/会议事项章节会议稿件同行评审

17 引用 (Scopus)

摘要

This paper reports a high-sensitive MEMS resonant electrometer based on mode localization of two weakly coupled resonators (WCRs). In the electrometer, the small electric charge input will cause a stiffness perturbation to one resonator of the WCRs, leading to a drastic change of the mode shape owing to the mode localization phenomena. By measuring the shift of the amplitude ratio, the small charge fluctuation can be accurately sensed. The experimental results show that with a charge input of 144fC the relative sensitivity based on the amplitude ratio is 663751ppm, which is -2341 times higher than that of the frequency (283.56ppm).

源语言英语
主期刊名MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
出版商Institute of Electrical and Electronics Engineers Inc.
87-90
页数4
ISBN(电子版)9781509019731
DOI
出版状态已出版 - 26 2月 2016
活动29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016 - Shanghai, 中国
期限: 24 1月 201628 1月 2016

出版系列

姓名Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
2016-February
ISSN(印刷版)1084-6999

会议

会议29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
国家/地区中国
Shanghai
时期24/01/1628/01/16

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