TY - GEN
T1 - A high-sensitive resonant electrometer based on mode localization of the weakly coupled resonators
AU - Zhang, Hemin
AU - Yuan, Weizheng
AU - Huang, Jie
AU - Li, Boyang
AU - Chang, Honglong
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/2/26
Y1 - 2016/2/26
N2 - This paper reports a high-sensitive MEMS resonant electrometer based on mode localization of two weakly coupled resonators (WCRs). In the electrometer, the small electric charge input will cause a stiffness perturbation to one resonator of the WCRs, leading to a drastic change of the mode shape owing to the mode localization phenomena. By measuring the shift of the amplitude ratio, the small charge fluctuation can be accurately sensed. The experimental results show that with a charge input of 144fC the relative sensitivity based on the amplitude ratio is 663751ppm, which is -2341 times higher than that of the frequency (283.56ppm).
AB - This paper reports a high-sensitive MEMS resonant electrometer based on mode localization of two weakly coupled resonators (WCRs). In the electrometer, the small electric charge input will cause a stiffness perturbation to one resonator of the WCRs, leading to a drastic change of the mode shape owing to the mode localization phenomena. By measuring the shift of the amplitude ratio, the small charge fluctuation can be accurately sensed. The experimental results show that with a charge input of 144fC the relative sensitivity based on the amplitude ratio is 663751ppm, which is -2341 times higher than that of the frequency (283.56ppm).
UR - http://www.scopus.com/inward/record.url?scp=84970965922&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2016.7421564
DO - 10.1109/MEMSYS.2016.7421564
M3 - 会议稿件
AN - SCOPUS:84970965922
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 87
EP - 90
BT - MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
Y2 - 24 January 2016 through 28 January 2016
ER -