TY - JOUR
T1 - 多金属层诱导透射紫外"日盲"探测成像滤光片设计与低温制备研究
AU - Shang, Peng
AU - Xiong, Jinping
AU - Ji, Yiqin
AU - Liu, Huasong
AU - Liu, Dandan
AU - Zhuang, Kewen
AU - Liu, Xu
AU - Shen, Weidong
N1 - Publisher Copyright:
© 2018, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved.
PY - 2018/9/25
Y1 - 2018/9/25
N2 - Based on the basic structural unit of SiO2/Al/SiO2, the optical constants of thin Al films were obtained accurately by fitting the multi angle ellipse polarization spectrum and the transmittance spectrum. And the influences of the thickness of Al film on the optical constants was also studied and analyzed. Theoretically, the three cavity UV induced transmission filter was obtained by using the admittance matching method. And the influence of preparation error of Al and SiO2 dielectric matching layer on the spectral properties of UV filters was systematically analyzed. Based on the low temperature, the high vacuum growth process of Al and SiO2 thin films, the high performance three cavity UV induced transmission filter were successfully prepared. The peak wavelength was located near 218 nm, and the peak transmittance was ~23.1%, and the bandwidth was ~32 nm. The transmittance in the 280 nm, 318 nm bands were about 0.5% and 0.04%, respectively. The cut-off rates of the samples were about 5.0 OD and 4.5 OD in the range of 400-700 nm and 800-1 100 nm, respectively. The results of this study have a good theoretical and practical significance for depositing the visible-near infrared band deep cut-off and UV induced transmission filters.
AB - Based on the basic structural unit of SiO2/Al/SiO2, the optical constants of thin Al films were obtained accurately by fitting the multi angle ellipse polarization spectrum and the transmittance spectrum. And the influences of the thickness of Al film on the optical constants was also studied and analyzed. Theoretically, the three cavity UV induced transmission filter was obtained by using the admittance matching method. And the influence of preparation error of Al and SiO2 dielectric matching layer on the spectral properties of UV filters was systematically analyzed. Based on the low temperature, the high vacuum growth process of Al and SiO2 thin films, the high performance three cavity UV induced transmission filter were successfully prepared. The peak wavelength was located near 218 nm, and the peak transmittance was ~23.1%, and the bandwidth was ~32 nm. The transmittance in the 280 nm, 318 nm bands were about 0.5% and 0.04%, respectively. The cut-off rates of the samples were about 5.0 OD and 4.5 OD in the range of 400-700 nm and 800-1 100 nm, respectively. The results of this study have a good theoretical and practical significance for depositing the visible-near infrared band deep cut-off and UV induced transmission filters.
KW - Al/SiO
KW - Electron beam evaporation
KW - Thin film
KW - UV induced filter
UR - http://www.scopus.com/inward/record.url?scp=85057142387&partnerID=8YFLogxK
U2 - 10.3788/IRLA201847.0920002
DO - 10.3788/IRLA201847.0920002
M3 - 文章
AN - SCOPUS:85057142387
SN - 1007-2276
VL - 47
JO - Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
JF - Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
IS - 9
M1 - 0920002
ER -