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The evolution of microstructure and electrical performance in doped Mn-Co and Cu-Mn oxide layers with the extended oxidation time
P. Y. Guo, H. Sun, Y. Shao, J. T. Ding, J. C. Li, M. R. Huang, S. Y. Mao, Y. X. Wang, J. F. Zhang, R. C. Long, X. H. Hou
Research output: Contribution to journal › Article › peer-review