The effect of chemical polishing treatment on the microstructure, photoelectric properties of CdZnTe polycrystalline films

Yiwei Li; Yawei Wang; Wenyu Zhang; Kun Cao; Yang Li; Gangqiang Zha; Tingting Tan

doi:10.1016/j.mssp.2020.105608

The effect of chemical polishing treatment on the microstructure, photoelectric properties of CdZnTe polycrystalline films

Yiwei Li, Yawei Wang, Wenyu Zhang, Kun Cao, Yang Li, Gangqiang Zha, Tingting Tan

School of Materials Sience and Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In this paper, CdZnTe polycrystalline film grown by the close-spaced sublimation (CSS) was chemically polished. Energy dispersive spectrum (EDS), atomic force microscope (AFM), Raman spectroscopy, current-voltage (I–V) characteristics and current-time (I-T) measurements were used to test the effect of the corrosion time of brominated methanol etching solution (with the ratio of CH₃OH:Br₂ = 50:1.5) on the structure, surface morphology and photoelectric properties of CdZnTe polycrystalline films. The results indicate that appropriate chemical polishing time can reduce the surface roughness, surface defects and leakage current of CdZnTe film and improve the photoelectric properties of CdZnTe film.

Original language	English
Article number	105608
Journal	Materials Science in Semiconductor Processing
Volume	124
DOIs	https://doi.org/10.1016/j.mssp.2020.105608
State	Published - 15 Mar 2021

Keywords

CdZnTe polycrystalline Film
Chemical polishing
Close-spaced sublimation
Photoelectric performance

Access to Document

10.1016/j.mssp.2020.105608

Cite this

@article{b61914e5be0043c7a34eaa056c0371e9,

title = "The effect of chemical polishing treatment on the microstructure, photoelectric properties of CdZnTe polycrystalline films",

abstract = "In this paper, CdZnTe polycrystalline film grown by the close-spaced sublimation (CSS) was chemically polished. Energy dispersive spectrum (EDS), atomic force microscope (AFM), Raman spectroscopy, current-voltage (I–V) characteristics and current-time (I-T) measurements were used to test the effect of the corrosion time of brominated methanol etching solution (with the ratio of CH3OH:Br2 = 50:1.5) on the structure, surface morphology and photoelectric properties of CdZnTe polycrystalline films. The results indicate that appropriate chemical polishing time can reduce the surface roughness, surface defects and leakage current of CdZnTe film and improve the photoelectric properties of CdZnTe film.",

keywords = "CdZnTe polycrystalline Film, Chemical polishing, Close-spaced sublimation, Photoelectric performance",

author = "Yiwei Li and Yawei Wang and Wenyu Zhang and Kun Cao and Yang Li and Gangqiang Zha and Tingting Tan",

note = "Publisher Copyright: {\textcopyright} 2020 Elsevier Ltd",

year = "2021",

month = mar,

day = "15",

doi = "10.1016/j.mssp.2020.105608",

language = "英语",

volume = "124",

journal = "Materials Science in Semiconductor Processing",

issn = "1369-8001",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - The effect of chemical polishing treatment on the microstructure, photoelectric properties of CdZnTe polycrystalline films

AU - Li, Yiwei

AU - Wang, Yawei

AU - Zhang, Wenyu

AU - Cao, Kun

AU - Li, Yang

AU - Zha, Gangqiang

AU - Tan, Tingting

PY - 2021/3/15

Y1 - 2021/3/15

N2 - In this paper, CdZnTe polycrystalline film grown by the close-spaced sublimation (CSS) was chemically polished. Energy dispersive spectrum (EDS), atomic force microscope (AFM), Raman spectroscopy, current-voltage (I–V) characteristics and current-time (I-T) measurements were used to test the effect of the corrosion time of brominated methanol etching solution (with the ratio of CH3OH:Br2 = 50:1.5) on the structure, surface morphology and photoelectric properties of CdZnTe polycrystalline films. The results indicate that appropriate chemical polishing time can reduce the surface roughness, surface defects and leakage current of CdZnTe film and improve the photoelectric properties of CdZnTe film.

AB - In this paper, CdZnTe polycrystalline film grown by the close-spaced sublimation (CSS) was chemically polished. Energy dispersive spectrum (EDS), atomic force microscope (AFM), Raman spectroscopy, current-voltage (I–V) characteristics and current-time (I-T) measurements were used to test the effect of the corrosion time of brominated methanol etching solution (with the ratio of CH3OH:Br2 = 50:1.5) on the structure, surface morphology and photoelectric properties of CdZnTe polycrystalline films. The results indicate that appropriate chemical polishing time can reduce the surface roughness, surface defects and leakage current of CdZnTe film and improve the photoelectric properties of CdZnTe film.

KW - CdZnTe polycrystalline Film

KW - Chemical polishing

KW - Close-spaced sublimation

KW - Photoelectric performance

UR - http://www.scopus.com/inward/record.url?scp=85097321532&partnerID=8YFLogxK

U2 - 10.1016/j.mssp.2020.105608

DO - 10.1016/j.mssp.2020.105608

M3 - 文章

AN - SCOPUS:85097321532

SN - 1369-8001

VL - 124

JO - Materials Science in Semiconductor Processing

JF - Materials Science in Semiconductor Processing

M1 - 105608

ER -

The effect of chemical polishing treatment on the microstructure, photoelectric properties of CdZnTe polycrystalline films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this