Study on the composition deviations in CZT crystal grown by MVB method

Tao Wang, Ge Yang, Dongmei Zeng, Yadong Xu, Wanqi Jie

Research output: Contribution to journalArticlepeer-review

Abstract

This paper focuses on the composition deviations in Cd0.96Zn0.04Te crystal grown by MVB method and its influences on the crystal properties. The composition distributions were measured by X-ray energy spectrometer. The results showed that the values of (Cd+Zn)/Te are greater than 1 in the initial part of CZT ingot and decreased along the axis, which proves that there are still composition deviations in CZT crystal. The ingot was grown from the Cd-rich melt in the first-to-freeze region and from the Te-rich melt in the last-to-freeze region. The photoluminescence spectra show that there exists higher Te vacancy in Cd-rich CZT wafers and higher Cd vacancy and related defects in Te-rich CZT wafers. IR transmittance measurements indicate that higher deviation from the stoichiometric composition corresponds with lower IR transmittance.

Original languageEnglish
Pages (from-to)345-347
Number of pages3
JournalPan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Volume28
Issue numberSUPPL.
StatePublished - Sep 2007

Keywords

  • CdZnTe
  • IR transmittance
  • PL spectra
  • Stoichiometric deviation

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