Study of etch pits on (111) surface of Hg3In2Te6 crystal

Lin Luo, Wan Qi Jie, Ye Sun, Tao Wang, Li Fu

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Etch pits on the (111) face of Hg3In2Te6 sample etched by modified Chen solution are investigated by means of scanning electron microscopy, scanning probe microscopy and electron backscatter diffraction instrument. The experimental results show that there are three basic etch pits: line shape, shuttle shape and date shape. In addition, black lines which are (111) plane projections of grooves in the latter two etch pits are oriented in three directions which are at 120° angles to one another. Further analyses show that the formation process of the three etch pits can be explained by the model of double cross-slip of screw dislocation.

Original languageEnglish
Pages (from-to)1853-1856
Number of pages4
JournalGongneng Cailiao/Journal of Functional Materials
Volume41
Issue number10
StatePublished - Oct 2010

Keywords

  • Dislocation
  • Double cross-slip
  • Electron backscatter diffraction
  • Etch pits
  • HgInTe

Fingerprint

Dive into the research topics of 'Study of etch pits on (111) surface of Hg3In2Te6 crystal'. Together they form a unique fingerprint.

Cite this