Single-shot large beam laser induced damage threshold measurement on dielectric coatings

Zhichao Liu; Yi Zheng; Qian Wu; Feng Pan; Jin Luo; Qinghua Zhang; Jian Wang; Ping Ma; Qiao Xu

doi:10.11884/HPLPB201527.052006

Single-shot large beam laser induced damage threshold measurement on dielectric coatings

Zhichao Liu, Yi Zheng, Qian Wu, Feng Pan, Jin Luo, Qinghua Zhang, Jian Wang, Ping Ma, Qiao Xu

Chengdu Fine Optical Engineering Research Center

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A novel method for laser induced damage threshold (LIDT) test of dielectric coatings is discussed in order to solve the time-consuming problem in traditional LIDT test. Single shot with large beam is used to get the LIDTs based on image processing technique. Following the coordinate conversion, image girding and compression procedure, the damage information could be extracted by comparing the sub-damage-spots distribution with the laser intensity distribution in the irradiated region. And finally the LIDT could be obtained from this information. This new method could greatly increase the efficiency of LIDT test. Moreover, the single-shot large beam LIDT testing bench is introduced and the availability of this method is confirmed on HfO₂/SiO₂ high reflectors.

Original language	English
Article number	052006
Journal	Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
Volume	27
Issue number	5
DOIs	https://doi.org/10.11884/HPLPB201527.052006
State	Published - 1 May 2015
Externally published	Yes

Keywords

Dielectric coatings
Feature extraction
Large beam
Laser induced damage threshold

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10.11884/HPLPB201527.052006

Cite this

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title = "Single-shot large beam laser induced damage threshold measurement on dielectric coatings",

abstract = "A novel method for laser induced damage threshold (LIDT) test of dielectric coatings is discussed in order to solve the time-consuming problem in traditional LIDT test. Single shot with large beam is used to get the LIDTs based on image processing technique. Following the coordinate conversion, image girding and compression procedure, the damage information could be extracted by comparing the sub-damage-spots distribution with the laser intensity distribution in the irradiated region. And finally the LIDT could be obtained from this information. This new method could greatly increase the efficiency of LIDT test. Moreover, the single-shot large beam LIDT testing bench is introduced and the availability of this method is confirmed on HfO2/SiO2 high reflectors.",

keywords = "Dielectric coatings, Feature extraction, Large beam, Laser induced damage threshold",

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TY - JOUR

T1 - Single-shot large beam laser induced damage threshold measurement on dielectric coatings

AU - Liu, Zhichao

AU - Zheng, Yi

AU - Wu, Qian

AU - Pan, Feng

AU - Luo, Jin

AU - Zhang, Qinghua

AU - Wang, Jian

AU - Ma, Ping

AU - Xu, Qiao

PY - 2015/5/1

Y1 - 2015/5/1

N2 - A novel method for laser induced damage threshold (LIDT) test of dielectric coatings is discussed in order to solve the time-consuming problem in traditional LIDT test. Single shot with large beam is used to get the LIDTs based on image processing technique. Following the coordinate conversion, image girding and compression procedure, the damage information could be extracted by comparing the sub-damage-spots distribution with the laser intensity distribution in the irradiated region. And finally the LIDT could be obtained from this information. This new method could greatly increase the efficiency of LIDT test. Moreover, the single-shot large beam LIDT testing bench is introduced and the availability of this method is confirmed on HfO2/SiO2 high reflectors.

AB - A novel method for laser induced damage threshold (LIDT) test of dielectric coatings is discussed in order to solve the time-consuming problem in traditional LIDT test. Single shot with large beam is used to get the LIDTs based on image processing technique. Following the coordinate conversion, image girding and compression procedure, the damage information could be extracted by comparing the sub-damage-spots distribution with the laser intensity distribution in the irradiated region. And finally the LIDT could be obtained from this information. This new method could greatly increase the efficiency of LIDT test. Moreover, the single-shot large beam LIDT testing bench is introduced and the availability of this method is confirmed on HfO2/SiO2 high reflectors.

KW - Dielectric coatings

KW - Feature extraction

KW - Large beam

KW - Laser induced damage threshold

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U2 - 10.11884/HPLPB201527.052006

DO - 10.11884/HPLPB201527.052006

M3 - 文章

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Single-shot large beam laser induced damage threshold measurement on dielectric coatings

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Keywords

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